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Volumn 39, Issue 1, 1997, Pages 104-108

Kinetics of the initial stage in a first-order phase transformation in thin films

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EID: 0040601117     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1129809     Document Type: Article
Times cited : (4)

References (31)
  • 3
    • 0041985957 scopus 로고
    • F. S. Zeltser, T. K. Soboleva, and A. E. Filippov, Zh. Éksp. Teor. Fiz. 108, 356 (1995) [JETP 81, 193 (1995)].
    • (1995) JETP , vol.81 , pp. 193
  • 6
    • 54749128918 scopus 로고
    • V. G. Boiko, H.-J. Mögel, V. M. Sysoev, and A. V. Chalyǐ, Usp. Fiz. Nauk 161, No. 2, 77 (1991) [Sov. Phys. Usp. 34, 141 (1991)].
    • (1991) Sov. Phys. Usp. , vol.34 , pp. 141
  • 13
    • 0040939359 scopus 로고
    • A. V. Osipov, Fiz. Tverd. Tela (St. Petersburg) 36, 1213 (1994) [Phys. Solid State 36, 664 (1994)].
    • (1994) Phys. Solid State , vol.36 , pp. 664
  • 15
    • 0030541253 scopus 로고    scopus 로고
    • S. A. Kukushkin and A. V. Osipov, Fiz. Tverd. Tela (St. Petersburg) 38, 443 (1996) [Phys. Solid State 38, 244 (1996)].
    • (1996) Phys. Solid State , vol.38 , pp. 244
  • 22
    • 0030508536 scopus 로고    scopus 로고
    • V. P. Afanas'ev, S. V. Bogachev, N. V. Zaitseva, E. Yu. Kaptelov, G. P. Kramar, A. A. Petrov, and I. I. Pronin, Zh. Tekh. Fiz. 66, 1831 (1996) [Tech. Phys. 41, 607 (1996)].
    • (1996) Tech. Phys. , vol.41 , pp. 607
  • 25
    • 0007234108 scopus 로고
    • Mir, Moscow
    • Fundamentals of Silicon Integrated Device Technology, Vol. 1, Oxidation, Diffusion, and Epitaxy, Ed. by R. M. Burger and R. P. Donovan, Prentice-Hall, Englewood Cliffs (1967); Mir, Moscow (1969).
    • (1969) Fundamentals of Silicon Integrated Device Technology
  • 31
    • 0348029470 scopus 로고
    • N. K. Yushin and A. V. Sotnikov, Fiz. Tverd. Tela (Leningrad) 22, 2272 (1980) [Sov. Phys. Solid State 22, 1615 (1980)].
    • (1980) Sov. Phys. Solid State , vol.22 , pp. 1615


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.