Evaluation of the trap concentration in highly doped semiconductors from low-frequency noise spectra

Journal of Applied Physics

Volumn 66, Issue 1, 1989, Pages 219-222

  Kugler, S ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

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Indexed keywords

EID: 0040590143     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.343909     Document Type: Article

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