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Volumn 28, Issue 3, 1997, Pages 229-238

Validation of numerical models of ceramic pin grid array packages

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040569340     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(96)00027-4     Document Type: Article
Times cited : (1)

References (10)
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  • 3
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    • S.C. O'Mathuna, Development and analysis of an automate test system for the thermal characterization of IC packaging technologies, IEEE Trans. CHMT, 15(5) (Oct. 1992) 615-624.
    • (1992) IEEE Trans. CHMT , vol.15 , Issue.5 , pp. 615-624
    • O'Mathuna, S.C.1
  • 4
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    • Junction-to-case thermal resistance still a myth?
    • V.B. Dutta, Junction-to-case thermal resistance still a myth?, 4th SEMITHERM, 1988.
    • (1988) 4th SEMITHERM
    • Dutta, V.B.1
  • 5
    • 0023862363 scopus 로고
    • Factors affecting semiconductor device thermal resistance measurements
    • B.S. Siegal, Factors affecting semiconductor device thermal resistance measurements, 4th SEMITHERM, 1988.
    • (1988) 4th SEMITHERM
    • Siegal, B.S.1
  • 6
    • 0025549391 scopus 로고
    • A review of thermal enhancement techniques for electronic systems
    • L.S. Fletcher, A review of thermal enhancement techniques for electronic systems, I-THERM II, 1990.
    • (1990) I-THERM , vol.2
    • Fletcher, L.S.1
  • 7
    • 5844425844 scopus 로고
    • Experimental thermal characterization of electronic packages in a fluid bath environment
    • F. Christiaens, E. Beyne, W. Temmerman, K. Allaert and W. Nelemans, Experimental thermal characterization of electronic packages in a fluid bath environment, Eurotherm 45, 1995.
    • (1995) Eurotherm , vol.45
    • Christiaens, F.1    Beyne, E.2    Temmerman, W.3    Allaert, K.4    Nelemans, W.5
  • 8
    • 0021376975 scopus 로고
    • Thermal evaluation of VLSI packages using test chips a critical review
    • Feb.
    • F. Oettinger, Thermal evaluation of VLSI packages using test chips a critical review, Solid State Technol., 27(2) (Feb. 1984) 169-179.
    • (1984) Solid State Technol. , vol.27 , Issue.2 , pp. 169-179
    • Oettinger, F.1
  • 9
    • 0041129814 scopus 로고
    • Effect of case temperature measurement errors on the junction-to-case thermal resistance of a ceramic PGA
    • R.L. Kozarek, Effect of case temperature measurement errors on the junction-to-case thermal resistance of a ceramic PGA, 7th SEMITHERM, 1991.
    • (1991) 7th SEMITHERM
    • Kozarek, R.L.1
  • 10
    • 0039942983 scopus 로고
    • Thermal resistance measurements and finite element calculations for ceramic hermetic packages
    • J.N. Sweet and W.T. Cooley, Thermal resistance measurements and finite element calculations for ceramic hermetic packages, 6th SEMITHERM, 1990.
    • (1990) 6th SEMITHERM
    • Sweet, J.N.1    Cooley, W.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.