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For XAFS measurements around the Cr K-edge (5.997 keV), the diffraction angle (θ) on the monochromator crystal (LiF(200) surface, 2d = 4.0267 Å, d is the interplanar spacing) center must be set to 30.92°. This angle is much higher than that of previous measurements around the Cu K-edge (8.99 keV), and the reflection efficiency on the monochromator crystal is then lowered at the Cr K-edge. The use of other flat crystals with a larger d value, such as Ge(111) and Si(220), will make θ lower and will overcome the above problems. However, since the absorption of X-rays by these heavy monochromator elements becomes high, the reflection efficiency is also lowered.
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