Rietveld analysis using a laboratory-based high pressure x-ray diffraction system and film-based detection

Review of Scientific Instruments

Volumn 68, Issue 6, 1997, Pages 2298-2300

  Hasegawa, Masashi ^a   Badding, John V ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040555348     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148138     Document Type: Article

References (19)

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