Numerical modeling of microplasma instability

Semiconductors

Volumn 31, Issue 2, 1997, Pages 146-149

  Datsko, B I ^a  

^a INSTITUTE OF HYDROBIOLOGY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040514767     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1187097     Document Type: Article

References (12)

1. I. V. Grekhov and Yu. N. Serezhkin, Avalanche Breakdown of p-n Junciions in Semiconductors [in Russian], Énergiya, Leningrad, 1980.
2. R. V. Konakova, P. Kordash et al., in Prediction of the Reliability of Semiconductor Avalanche Diodes [in Russian], edited by Yu. A. Tkhorik, Naukova dumka, Kiev, 1986.
3. V. V. Gafiǐchuk, B. J. Datsko, B. S. Kerner, and V. V. Osipov, Fiz. Tekh. Poluprovodn. 24, 724 (1990) [Sov. Phys. Semicond. 24, 455 (1990)].
4. V. V. Gafiǐchuk, B. J. Datsko, B. S. Kerner, and V. V. Osipov, Fiz. Tekh. Poluprovodn. 24, 724 (1990) [Sov. Phys. Semicond. 24, 455 (1990)].
5. V. A. Vashchenko, B. S. Kerner, V. V. Osipov, and V. F. Sinkevich, Fiz. Tekh. Poluprovodn. 24, 1705 (1990) [Sov. Phys. Semicond. 24, 1065 (1990)].
6. V. A. Vashchenko, B. S. Kerner, V. V. Osipov, and V. F. Sinkevich, Fiz. Tekh. Poluprovodn. 24, 1705 (1990) [Sov. Phys. Semicond. 24, 1065 (1990)].
7. V. V. Gafiǐhuk, B. I. Datsko, B. S. Kerner, and V. V. Osipov, Fiz. Tekh. Poluprovodn. 24, 1282 (1990) [Sov. Phys. Semicond. 24, 806 (1990)].
8. V. V. Gafiǐhuk, B. I. Datsko, B. S. Kerner, and V. V. Osipov, Fiz. Tekh. Poluprovodn. 24, 1282 (1990) [Sov. Phys. Semicond. 24, 806 (1990)].
9. B. S. Kerner and B. V. Osipov, Usp. Fiz. Nauk 157, 201 (1989) [Sov. Phys. Usp. 32, 101 (1989)].
10. B. S. Kerner and B. V. Osipov, Usp. Fiz. Nauk 157, 201 (1989) [Sov. Phys. Usp. 32, 101 (1989)].
11. P. L. Hower and K. G. Reddi, IEEE Trans. ED-17, 320 (1970).
12. S. Sze, Physics of Semiconductor Devices, Wiley, N.Y., 1981, 2nd edition [Russian translation, Mir, Moscow, 1984].