The study and modification of oxide surfaces using focussed laser pulses

Electrochimica Acta

Volumn 41, Issue 2, 1996, Pages 257-265

  Preusser, S ^a   Stimming, U ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Focussed laser pulse; PECLI; SEM

Indexed keywords

EID: 0040454818     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/0013-4686(95)00306-Y     Document Type: Article

References (10)

1. S. Preusser, L. Stimming and S. Tokunaga, J. electrochem. Soc. 142, 102 (1995).
2. A. R. Newmark and U. Stimming, Langmuir 3, 905 (1987).
3. M. H. Dean and U. Stimming, Corrosion Science 29, 199 (1989).
4. U. Stimming, Langmuir 3, 423 (1987).
5. K. Leitner and J. W. Schultze, Ber. Bunsenges. Phys. Chem. 92, 181 (1988).
6. J. W. Schultze and J. Thietke, Electrochimica Acta 34, 1769 (1989).
7. S. Preusser, U. Stimming and K. Wippermann, Electrochimica Acta 39, 1273 (1994).
8. We used a flatband potential of 0.27V (nhe), as found by potentially modulated reflectance spectroscopy: D. J. Blackwood and L. M. Peter, Electrochim. Acta 35, 1073 (1990).
9. Ian M. Watt, The Principles and Practice of Electron Microscopy, p. 111. Cambridge University Press, Cambridge, UK (1985).
10. E. Fuchs, H. Oppolzer and H. Rehme, Particle Beam Microanalysis, pps. 93-95. VCH Verlaggesellschaft mbH, Weinheim, Germany (1990).