A new method for measuring the degree of preferred orientation in bulk textured YBa2Cu3Ox

Physica C: Superconductivity and its Applications

Volumn 277, Issue 1-2, 1997, Pages 82-86

  Leventouri, Theodora ^a  

^a FLORIDA ATLANTIC UNIVERSITY   (United States)

Author keywords

Bulk textured superconductors; Grain alignment (texturing)

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; HIGH TEMPERATURE SUPERCONDUCTORS; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

BULK TEXTURED SUPERCONDUCTORS; GRAIN ALIGNMENT; MARCH FUNCTIONS; PREFERRED ORIENTATION (PO);

OXIDE SUPERCONDUCTORS;

EID: 0040453488     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)00063-4     Document Type: Article

References (12)

1. R.A. Young (Ed.), The Rietveld Method, IUCr (Oxford Science Publ., 1993).
2. H.P. Klug and L.E. Alexander, X-ray Diffraction Procedures (Wiley, New York, 1974).
3. A. March, Z. Kristallogr. 81 (1932) 285.
4. W.A. Dollase, J. Appl. Crystall. 19 (1986) 267.
5. E.A. Judson, D.N. Hill, R.A. Young, J.R. Cagle, W.U. Lackey, W.B. Carter, E.K. Barefield, J. Powder Diffract. 9 (1994) 250.
6. R.B. von Dreele, J. Appl. Crystall., to be published.
7. A.C. Larson and R.B. Von Dreele, GSAS - General Structures Analysis System, Los Alamos National Laboratory, 1986.
8. "Win-Rietveld", a structure refinement program developed for Siemens MS-Windows from the original refinement code DBWS (Wiles, Sakthivel and Young, Georgia Institute of Technology).
9. A. Williams, G.H. Kwei, R.B. Von Dreele, A.C. Larson, I.D. Raistrick, K.L. Bish, Phys. Rev. B 37 (1988) 7960.
10. Th. Leventouri, F.D. Medina, B.D. Landreth, Solid State Commun. 85 (1993) 675.
11. Th. Leventouri, E. Liarokapis, J.S. Faulkner, Solid State Commun. 74 (1990) 1103.
12. W. Wong-Ng, H.F. McMurdie, B. Paretzkin, Y. Zhang, K.L. Davis, C.R. Hubbard, A.L. Dragoo, J.M. Stewart, J. Powder Diffract. 2 (1987) 192.