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Volumn 53, Issue 16, 1996, Pages 10715-10727

Coexistence of the DX center with nonmetastable states of the donor impurity in Si-dopeAs: Effects on the low-temperature electron mobility

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Indexed keywords


EID: 0040442588     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.10715     Document Type: Article
Times cited : (5)

References (32)
  • 2
    • 85037901180 scopus 로고
    • T. N. Theis, in Defects in Materials, edited by P. D. Bristowe et. al MRS Symposia Proceedings No. 209 (Materials Research Society, Pittsburgh, 1991), p. 367.
    • (1991) Defects in Materials , pp. 367
    • Theis, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.