Circuit optimization via sequential computer experiments: Design of an output buffer

Journal of the Royal Statistical Society. Series C: Applied Statistics

Volumn 47, Issue 1, 1998, Pages 31-48

  Aslett, Robert ^a   Buck, Robert J ^b   Duvall, Steven G ^e   Sacks, Jerome ^c   Welch, William J ^d  

^a INTEL CORPORATION   (United States)

^b WESTERN MICHIGAN UNIVERSITY   (United States)

^c NATIONAL INSTITUTE OF ENVIRONMENTAL HEALTH SCIENCES   (United States)

^d UNIVERSITY OF WATERLOO   (Canada)

^e NONE

Author keywords

Circuit simulator; Computer code; Computer model; Engineering design; Parameter design; Stochastic process; Visualization

Indexed keywords

EID: 0040427790     PISSN: 00359254     EISSN: None     Source Type: Journal    
DOI: 10.1111/1467-9876.00096     Document Type: Article

References (18)

1. Alvarez, A. R., Behrooz, L. A., Young, D. L., Weed, H. D., Teplik, J. and Herald, E. R. (1988) Application of statistical design and response surface methods to computer-aided VLSI device design. IEEE Trans. Comput. Aid. Design, 7, 272-288.
2. Bates, R. A., Buck, R. J., Riccomagno, E. and Wynn, H. P. (1996) Experimental design and observation for large systems. J. R. Statist. Soc. B, 58, 77-94.
3. Bernardo, M. C., Buck, R., Liu, L., Nazaret, W. A., Sacks, J. and Welch, W. J. (1992) Integrated circuit design optimization using a sequential strategy. IEEE Trans. Comput. Aid. Design, 11, 361-372.
4. Box, G. E. P. and Draper, N. R. (1959) A basis for the selection of a response surface design. J. Am. Statist. Ass., 54, 622-654.
5. Brayton, R. K., Hachtel, G. D. and Sangiovanni-Vincentelli, A. L. (1981) A survey of optimization techniques for integrated-circuit design. Proc. IEEE, 69, 1334-1363.
6. Currin, C., Mitchell, T., Morris, M. and Ylvisaker, D. (1991) Bayesian prediction of deterministic functions, with applications to the design and analysis of computer experiments. J. Am. Statist. Ass., 86, 953-963.
7. Gill, P. E., Murray, W., Saunders, M. A. and Wright, M. H. (1986) User's guide for NPSOL, version 4.0. Report SOL 86-2. Department of Operations Research, Stanford University, Stanford.
8. Hastie, T. J. and Tibshirani, R. J. (1990) Generalized Additive Models. London: Chapman and Hall.
9. Iman, R. L. and Conover, W. J. (1982) A distribution-free approach to inducing rank correlation among input variables. Communs Statist. Simuln Computn, 11, 311-334.
10. McKay, M. D., Conover, W. J. and Beckman, R. J. (1979) A comparison of three methods for selecting values of input variables in the analysis of output from a computer code. Technometrics, 21, 239-245.
11. Sacks, J., Schiller, S. B. and Welch, W. J. (1989a) Designs for computer experiments. Technometrics, 31, 41-47.
12. Sacks, J., Welch, W. J., Mitchell, T. J. and Wynn, H. P. (1989b) Design and analysis of computer experiments (with discussion). Statist. Sci., 4, 409-435.
13. Schonlau, M., Welch, W. J. and Jones, D. R. (1997) Global versus local search in constrained optimization of computer models. Research Report RR-97-11. Institute for Improvement in Quality and Productivity, University of Waterloo, Waterloo.
14. Su, H., Nelder, J. A., Wolbert, P. and Spence, R. (1996) Application of generalized linear models to the design improvement of an engineering artefact. Qual. Reliab. Engng Int., 12, 101-112.
15. Taguchi, G. (1986) Introduction to Quality Engineering. Tokyo: Asian Productivity Organization.
16. Welch, W. J., Buck, R. J., Sacks, J., Wynn, H. P., Mitchell, T. J. and Morris, M. D. (1992) Screening, predicting, and computer experiments. Technometrics, 34, 15-25.
17. Welch, W. J., Yu, T. K., Kang, S. M. and Sacks, J. (1990) Computer experiments for quality control by parameter design. J. Qual. Technol., 22, 15-22.
18. Yu, T. K., Kang, S. M., Sacks, J. and Welch, W. J. (1991) Parametric yield optimization of CMOS analogue circuits by quadratic statistical circuit performance models. Int. J. Circ. Theory Applic., 19, 579-592.