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Volumn 99, Issue 1-2, 1998, Pages 82-86

XPS and XRD study of the electrochromic mechanism of WOx films

Author keywords

Electrochromic; Ion valence; Phases; Relative content

Indexed keywords


EID: 0040420659     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00415-5     Document Type: Article
Times cited : (36)

References (10)
  • 10
    • 0042308661 scopus 로고
    • ch. 4, Electron Engineering Publishing House, Beijing
    • J.H. Lu, Technology of Surface Analysis, ch. 4, Electron Engineering Publishing House, Beijing, 1987.
    • (1987) Technology of Surface Analysis
    • Lu, J.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.