Interface broadening and Raman scattering i/Si superlattices

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 8, 1996, Pages 4699-4703

  Liu, Xiaohan ^a   Huang, Daming ^a   Jiang, Zuimin ^a   Wang, Xun ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040399200     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.4699     Document Type: Article

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