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Volumn 286, Issue 1, 2000, Pages 87-90
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Design and characterization of materials on the atomic scale
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Author keywords
Atomic resolution microscopy; Atomic scale; Molecular dynamics
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Indexed keywords
MICROSCOPIC EXAMINATION;
MOLECULAR DYNAMICS;
ATOMIC RESOLUTION MICROSCOPY;
ATOMIC SCALE ANALYSIS;
NANOSTRUCTURED MATERIALS;
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EID: 0040358914
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5093(00)00683-3 Document Type: Article |
Times cited : (8)
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References (27)
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