The effect of mode scrambling on pulsed radar reflectometry applied to high shear devices

Review of Scientific Instruments

Volumn 68, Issue 1, 1997, Pages 473-476

  Donne A J H ^a   De Baar, M ^a   Cavazzana, R ^a,b  

^a FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040341966     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147609     Document Type: Article

References (10)

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8. As brought forward during discussions at the International Workshop on Diagnostics for ITER, Varenna (1995).
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