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Volumn 42, Issue 1-3, 1996, Pages 297-301

Near band gap photoreflectance studies in CdTe, CdTe:V and CdTe:Ge crystals

Author keywords

Cadmium telluride; Photoreflectance

Indexed keywords

COMPOSITION EFFECTS; ENERGY GAP; GERMANIUM; SEMICONDUCTOR DOPING; THERMAL EFFECTS; VANADIUM;

EID: 0040338435     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(96)01725-4     Document Type: Article
Times cited : (13)

References (24)
  • 1
    • 0001720790 scopus 로고
    • T.S. Moss (ed.), North Holland, New York
    • D.E. Aspnes, in T.S. Moss (ed.), Handbook on Semiconductors, Vol. 2, North Holland, New York, 1980, p. 109.
    • (1980) Handbook on Semiconductors , vol.2 , pp. 109
    • Aspnes, D.E.1
  • 2
    • 0004995339 scopus 로고
    • R.K. Willardson and A.C. Beer (eds.), Academic, New York
    • B.O. Seraphin, in R.K. Willardson and A.C. Beer (eds.), Semiconductors and Semimetals, Vol. 9, Academic, New York, 1972, p. 1.
    • (1972) Semiconductors and Semimetals , vol.9 , pp. 1
    • Seraphin, B.O.1
  • 4
    • 0000804651 scopus 로고
    • R.N. Bhattacharya, H. Shen, P. Parayanthal, F.H. Pollak, T. Coutts and H. Aharoni, Proc. Soc. Photo-Opt. Instrum. Eng., 794 (1987) 81; Phys. Rev., B37 (1988) 4044.
    • (1988) Phys. Rev. , vol.B37 , pp. 4044
  • 13
    • 0042614363 scopus 로고
    • D.E. Aspnes, S. So and R.F. Potter (eds.) Society of Photo-Optical Instrumentation Engineers, Bellingham, WA
    • F.H. Pollak, in D.E. Aspnes, S. So and R.F. Potter (eds.) Optical Characterization for Semiconductor Technology, Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 1981; Proc. Soc. Photo. Opt. Inst. Eng., 276 (1981) 142.
    • (1981) Optical Characterization for Semiconductor Technology
    • Pollak, F.H.1
  • 14
    • 23644446305 scopus 로고
    • F.H. Pollak, in D.E. Aspnes, S. So and R.F. Potter (eds.) Optical Characterization for Semiconductor Technology, Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 1981; Proc. Soc. Photo. Opt. Inst. Eng., 276 (1981) 142.
    • (1981) Proc. Soc. Photo. Opt. Inst. Eng. , vol.276 , pp. 142


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.