-
1
-
-
0017219379
-
-
E. Spiller, D. E. Eastman, R. Feder, W. D. Grobman, W. Gudat, and J. Topalian, J. Appl. Phys. 47(12), 5450 (1976).
-
(1976)
J. Appl. Phys.
, vol.47
, Issue.12
, pp. 5450
-
-
Spiller, E.1
Eastman, D.E.2
Feder, R.3
Grobman, W.D.4
Gudat, W.5
Topalian, J.6
-
2
-
-
0000344827
-
-
R. Viswanathan, D. Seeger, A. Bright, T. Bucelot, A. Pomerene, K. Petrillo, P. Blauner, P. Agnello, and J. Warlaumont, J. Vac. Sci. Technol. B11, 2910 (1993).
-
(1993)
J. Vac. Sci. Technol.
, vol.B11
, pp. 2910
-
-
Viswanathan, R.1
Seeger, D.2
Bright, A.3
Bucelot, T.4
Pomerene, A.5
Petrillo, K.6
Blauner, P.7
Agnello, P.8
Warlaumont, J.9
-
3
-
-
0000667963
-
-
T. Hosokawa, T. Kitayama, T. Hayasaka, S. Ido, Y. Uno, A. Shibayama, J. Nakata, K. Nishimura, and M. Nakajima, Rev. Sci. Instrum. 60, 1783 (1989).
-
(1989)
Rev. Sci. Instrum.
, vol.60
, pp. 1783
-
-
Hosokawa, T.1
Kitayama, T.2
Hayasaka, T.3
Ido, S.4
Uno, Y.5
Shibayama, A.6
Nakata, J.7
Nishimura, K.8
Nakajima, M.9
-
4
-
-
0001037561
-
-
T. Kaneko, Y. Saitoh, S. Itabashi, and H. Yoshihara, J. Vac. Sci. Technol. B9, 3214 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 3214
-
-
Kaneko, T.1
Saitoh, Y.2
Itabashi, S.3
Yoshihara, H.4
-
5
-
-
0000185975
-
-
Ishihara, M. Kanai, A. Une, and M. Suzuki, J. Vac. Sci. Technol. B7, 1652 (1989).
-
(1989)
J. Vac. Sci. Technol.
, vol.B7
, pp. 1652
-
-
Ishihara1
Kanai, M.2
Une, A.3
Suzuki, M.4
-
6
-
-
0021610068
-
-
M. Sekimoto, A. Ozawa, T. Ohkubo, and H. Yoshihara, Extended Abstracts 16th Int. Conf. on Solid State Device Materials (Kobe, Japan) , 23 (1984).
-
(1984)
Extended Abstracts 16th Int. Conf. on Solid State Device Materials (Kobe, Japan)
, vol.23
-
-
Sekimoto, M.1
Ozawa, A.2
Ohkubo, T.3
Yoshihara, H.4
-
9
-
-
0028736491
-
-
M. Suzuki, M. Fukuda, F. Omata, H. Tsuyuzaki, T. Ohkubo, and I. Okada, Proc. SPIE 2254, 329 (1994).
-
(1994)
Proc. SPIE
, vol.2254
, pp. 329
-
-
Suzuki, M.1
Fukuda, M.2
Omata, F.3
Tsuyuzaki, H.4
Ohkubo, T.5
Okada, I.6
-
10
-
-
0038982639
-
-
to be published
-
K. Deguchi, K. Miyoshi, H. Ban, T. Matsuda, T. Ohno, and Y. Kado, J. Vac. Sci. Technol. Nov/Dec (1995) to be published.
-
(1995)
J. Vac. Sci. Technol.
, Issue.NOV-DEC
-
-
Deguchi, K.1
Miyoshi, K.2
Ban, H.3
Matsuda, T.4
Ohno, T.5
Kado, Y.6
-
12
-
-
0003654438
-
-
H. Ban, J. Nakamura, K. Deguchi, and A. Tanaka, J. Vac. Sci. Technol. B12, 3905 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 3905
-
-
Ban, H.1
Nakamura, J.2
Deguchi, K.3
Tanaka, A.4
-
13
-
-
0026928382
-
-
K. Deguchi, K. Miyoshi, T. Ishii, and T. Matsuda, Jpn. J. Appl. Phys. 31, 2954 (1992).
-
(1992)
Jpn. J. Appl. Phys.
, vol.31
, pp. 2954
-
-
Deguchi, K.1
Miyoshi, K.2
Ishii, T.3
Matsuda, T.4
-
15
-
-
0026962523
-
-
Y. Somemura, K. Deguchi, K. Miyoshi, and T. Matsuda, Jpn. J. Appl. Phys. 31, 4221 (1992).
-
(1992)
Jpn. J. Appl. Phys.
, vol.31
, pp. 4221
-
-
Somemura, Y.1
Deguchi, K.2
Miyoshi, K.3
Matsuda, T.4
-
16
-
-
0040166782
-
-
J. Xiao, M. Khan, R. Nachman, J. Wallace, Z. Chen, and F. Cerrina, J. Vac. Sci. Technol. B12, 4038 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 4038
-
-
Xiao, J.1
Khan, M.2
Nachman, R.3
Wallace, J.4
Chen, Z.5
Cerrina, F.6
-
17
-
-
0000800104
-
-
K. Deguchi, K. Miyoshi, H. Ban, H. Kyuragi, S. Konaka, and T. Matsuda, J. Vac. Sci. Technol. B10, 3145 (1992).
-
(1992)
J. Vac. Sci. Technol.
, vol.B10
, pp. 3145
-
-
Deguchi, K.1
Miyoshi, K.2
Ban, H.3
Kyuragi, H.4
Konaka, S.5
Matsuda, T.6
-
18
-
-
0039575351
-
-
S. Uchiyama, S. Ohki, A. Ozawa, T. Matsuda, and T. Morosawa, MicroProcess '95 Digest of Papers, 238 (1995).
-
(1995)
MicroProcess '95 Digest of Papers
, vol.238
-
-
Uchiyama, S.1
Ohki, S.2
Ozawa, A.3
Matsuda, T.4
Morosawa, T.5
-
19
-
-
0040760860
-
-
Kyuragi, S. Konaka, T. Kobayashi, K. Deguchi, E. Yamamoto, S. Ohki, and Y. Yamamoto, 1992 Symp. on VLSI Technol. Digest of Technical Papers 4-1,26 (1992).
-
(1992)
1992 Symp. on VLSI Technol. Digest of Technical Papers 4-1
, vol.26
-
-
Kyuragi1
Konaka, S.2
Kobayashi, T.3
Deguchi, K.4
Yamamoto, E.5
Ohki, S.6
Yamamoto, Y.7
-
20
-
-
4243971017
-
-
Y. Kado, T. Ohno, M. Harada, K. Deguchi, and T. Tsuchiya, IEDM, 243 (1993).
-
(1993)
IEDM
, vol.243
-
-
Kado, Y.1
Ohno, T.2
Harada, M.3
Deguchi, K.4
Tsuchiya, T.5
-
21
-
-
0040760859
-
-
to be published
-
I. Okada, T. Ohkubo, Y. Saitoh, M. Sekimoto, and T. Matsuda, Proc. SPIE (1995) to be published.
-
(1995)
Proc. SPIE
-
-
Okada, I.1
Ohkubo, T.2
Saitoh, Y.3
Sekimoto, M.4
Matsuda, T.5
-
22
-
-
0027580554
-
-
T. Tsuchiya, M. Harada, K. Deguchi, and T. Matsuda, IEICE Trans. Electron, E76-C(4), 506 (1993).
-
(1993)
IEICE Trans. Electron
, vol.E76-C
, Issue.4
, pp. 506
-
-
Tsuchiya, T.1
Harada, M.2
Deguchi, K.3
Matsuda, T.4
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