Theory of a scanning tunneling microscope with a two-protrusion tip

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 16, 1996, Pages R10536-R10539

  Flatté, Michael E ^a   Byers, Jeff M ^b  

^a UNIVERSITY OF IOWA   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040084190     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.R10536     Document Type: Article

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