Macroscopic ion traps at the silicon-oxide interface

Semiconductors

Volumn 32, Issue 12, 1998, Pages 1284-1288

  Dmitriev, S G ^a   Markin, Yu V ^a  

^a INST OF RADIO ENG AND ELECTRONICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040081217     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1187615     Document Type: Article

References (20)

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