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Volumn 184-185, Issue , 1998, Pages 218-222

Assignment of reflectance difference spectroscopy peaks to II-VI surface layers

Author keywords

II VI semiconductor surfaces; Molecular beam epitaxy; Reflectance difference spectroscopy; RHEED

Indexed keywords


EID: 0040036848     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)80048-1     Document Type: Article
Times cited : (6)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.