Out-diffusion of Zn from Si: A method to study vacancy properties in Si

Journal of Applied Physics

Volumn 83, Issue 12, 1998, Pages 8062-8064

  Giese, A ^a   Bracht, H ^a   Stolwijk, N A ^a   Walton, J T ^b  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039975975     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367900     Document Type: Article

References (12)

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