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Volumn 382, Issue 1-2, 1996, Pages 327-331
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A cesium-sputtering negative ion source for AMS investigations
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Author keywords
[No Author keywords available]
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Indexed keywords
CESIUM;
DESIGN;
EQUIPMENT TESTING;
ION BEAMS;
MASS SPECTROMETRY;
PARTICLE ACCELERATORS;
SPUTTERING;
ACCELERATOR MASS SPECTROMETRY;
CESIUM SPUTTERING NEGATIVE ION SOURCE;
GLASS AMPOULE;
SAMPLE HOLDER;
TANDEM ACCELERATORS;
ION SOURCES;
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EID: 0039909760
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00457-3 Document Type: Article |
Times cited : (9)
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References (6)
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