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Volumn 382, Issue 1-2, 1996, Pages 327-331

A cesium-sputtering negative ion source for AMS investigations

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; DESIGN; EQUIPMENT TESTING; ION BEAMS; MASS SPECTROMETRY; PARTICLE ACCELERATORS; SPUTTERING;

EID: 0039909760     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00457-3     Document Type: Article
Times cited : (9)

References (6)
  • 6
    • 0041319138 scopus 로고    scopus 로고
    • Computer code EGN2, obtained from Scientific Software
    • Computer code EGN2, obtained from Scientific Software


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.