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Volumn 73, Issue 1, 1993, Pages 277-288
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Generation of Si-SiO2 interface states by high electric field stress from low (100 K) to high (450 K) temperatures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039892889
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.353901 Document Type: Article |
Times cited : (27)
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References (90)
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