Characterization of Pb(Zr0.53 Ti0.47)O3 films on GaN

Chinese Physics Letters

Volumn 17, Issue 2, 2000, Pages 137-141

  Li, Wei Ping ^a   Zhang, Rong ^a   Zhou, Yu Gang ^a   Yin, Jiang ^a   Shen, Bo ^a   Shi, Yi ^a   Chen, Zhi Zhong ^a   Chen, Peng ^a   Liu, Zhi Guo ^a   Zheng, You Dou ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC FILMS; FERROELECTRICITY; III-V SEMICONDUCTORS; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; ORGANIC CHEMICALS; ORGANOMETALLICS; PEROVSKITE; PULSED LASER DEPOSITION; WIDE BAND GAP SEMICONDUCTORS; X RAY DIFFRACTION; ZIRCONIUM COMPOUNDS;

APPLIED VOLTAGES; CHEMICAL DEPOSITION; HIGH THERMAL STABILITY; LIGHT RADIATION; LOW PRESSURES; METALORGANICS; PEROVSKITE STRUCTURES; PULSED-LASER DEPOSITION; RADIATION HEATING; X- RAY DIFFRACTIONS;

GALLIUM NITRIDE;

EID: 0039849591     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/17/2/022     Document Type: Article

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