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Volumn 108, Issue 1-2, 1996, Pages 197-204
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A compact flat-crystal x-ray spectrometer for external beam pixe measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039769012
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(95)00787-3 Document Type: Article |
Times cited : (7)
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References (25)
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