메뉴 건너뛰기




Volumn 108, Issue 1-2, 1996, Pages 197-204

A compact flat-crystal x-ray spectrometer for external beam pixe measurements

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0039769012     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00787-3     Document Type: Article
Times cited : (7)

References (25)
  • 8
    • 0040746429 scopus 로고
    • thesis in Physics, University of Florence, unpublished
    • P. Tesauro, thesis in Physics, University of Florence, 1992, unpublished.
    • (1992)
    • Tesauro, P.1
  • 10
    • 0040746418 scopus 로고    scopus 로고
    • Manufactured by GEC (U.K.)
    • Manufactured by GEC (U.K.).
  • 16
    • 0038968114 scopus 로고
    • thesis in Physics, University of Florence, unpublished
    • L. Barsantini, thesis in Physics, University of Florence, 1987, unpublished.
    • (1987)
    • Barsantini, L.1
  • 24
    • 0040746422 scopus 로고    scopus 로고
    • note
    • In the latter case, to make the use of alpha particles possible, the geometry of the end of the beam line was slightly modified. The target was in vacuum while a thin window allowed the particle-induced X-rays to be transmitted into the atmosphere, to the diffracting crystal and hence to the CCD as usual.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.