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Volumn 1998-February, Issue , 1998, Pages 58-63

Understanding models of substrate behaviour for the routing of high I/O packages

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; INTEGRATED CIRCUITS;

EID: 0039750648     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPDI.1998.663622     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 0030148914 scopus 로고    scopus 로고
    • Limitation of the signal pin density on wiring boards
    • T Chiba, M Yamada and F Kobayashi, Limitation of the Signal Pin Density on Wiring Boards, IEEE CPMT Transactions, 19, 391-396, 1996.
    • (1996) IEEE CPMT Transactions , vol.19 , pp. 391-396
    • Chiba, T.1    Yamada, M.2    Kobayashi, F.3
  • 2
    • 85044599220 scopus 로고    scopus 로고
    • Matching csp and flip chip i/o density demands to printed wiring board capabilities
    • 16-23, September
    • K V Guinn and R C Frye, Matching CSP and Flip Chip I/O Density Demands to Printed Wiring Board Capabilities, Chip Scale Review, 16-23, September 1997.
    • (1997) Chip Scale Review
    • Guinn, K.V.1    Frye, R.C.2
  • 4
    • 85044587362 scopus 로고    scopus 로고
    • Making the right connection
    • N Chandler and D Wooley, Making the right connection, Future Circuits, 1, No 1, 147-152, 1997
    • (1997) Future Circuits , vol.1 , Issue.1 , pp. 147-152
    • Chandler, N.1    Wooley, D.2
  • 5
    • 0012064518 scopus 로고    scopus 로고
    • Technology trends in electronics and photonics, their modelling and effect on manufacturing and assembly
    • D J Williams, P J Palmer and T C Edwards, Technology Trends in Electronics and Photonics, Their Modelling and Effect on Manufacturing and Assembly, Journal of Electronic Manufacturing, 7, 69-77, 1997.
    • (1997) Journal of Electronic Manufacturing , vol.7 , pp. 69-77
    • Williams, D.J.1    Palmer, P.J.2    Edwards, T.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.