Temperature dependence of photoreflectance measurements in Ga0.47In0.53As epitaxial layers

Semiconductor Science and Technology

Volumn 13, Issue 1, 1998, Pages 75-78

  'Bouamama, Kh ^a   Horig W ^b   Neumann, H ^c  

^a FERHAT ABBAS UNIVERSITY   (Algeria)

^b UNIVERSITY OF LEIPZIG   (Germany)

^c Bloquant GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039746447     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/1/011     Document Type: Article

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