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Volumn 90, Issue 10, 2001, Pages 4951-4956

Space-charge limited currents in coaxial diodes with electron backscatter

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0039741414     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1410891     Document Type: Article
Times cited : (15)

References (14)
  • 1
    • 0039184499 scopus 로고
    • American Society for Nondestructive Testing, Columbus, OH
    • See, for example, Proceedings of the Flash Radiography Symposium, 1976, 1984, 1986, and 1989 (American Society for Nondestructive Testing, Columbus, OH)
    • (1976) Proceedings of the Flash Radiography Symposium


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.