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Volumn 266, Issue , 1999, Pages 777-782
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Edge profiles and limiter tests in Extrap T2
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Author keywords
[No Author keywords available]
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Indexed keywords
COATINGS;
EXPERIMENTAL REACTORS;
GRAPHITE;
HEAT FLUX;
INTERFACES (MATERIALS);
ION BEAMS;
MICROSCOPIC EXAMINATION;
MOLYBDENUM ALLOYS;
PINCH EFFECT;
PROBES;
TUNGSTEN;
X RAY PHOTOELECTRON SPECTROSCOPY;
EDGE PROFILES;
REVERSE FIELD PINCH (RFP);
TEST LIMITERS;
TOKAMAK DEVICES;
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EID: 0039722942
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3115(98)00548-0 Document Type: Article |
Times cited : (3)
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References (10)
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