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Volumn 75, Issue 1, 1997, Pages 105-114

In-situ high-resolution electron microscopy study on a surface reconstruction of au-deposited Si at very high temperatures

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Indexed keywords


EID: 0039712618     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619708210285     Document Type: Article
Times cited : (18)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.