Electron Diffraction Patterns of Fibrous and Lamellar Textured Polycrystalline Thin Films. II. Applications

Journal of Applied Crystallography

Volumn 29 PART 4, Issue , 1996, Pages 419-426

  Tang, L ^a   Feng, Y C ^a   Lee, L L ^a   Laughlin, D E ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039695576     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896000416     Document Type: Article

References (8)

1. Cullity, B. D. (1978). Elements of X-ray Diffraction, p. 506. Reading, MA: Addison Wesley.
2. Deng, Y., Lambeth, D. N. & Laughlin, D. E. (1993). IEEE Trans. Magn. 29, 3676-3678.
3. JCPDS Diffraction Data Card (1992). ICDD No. 4-829. JCPDS (now International Centre for Diffraction Data), 1601 Park Lane, Swarthmore, Pennsylvania, USA.
4. Read, M. H. & Altman, C. (1965). Appl. Phys. Lett. 7, 51- 52.
5. Read, M. H. & Hensler, D. H. (1972). Thin Solid Films, 10, 123-135.
6. Tang, L. & Laughlin, D. E. (1996). J. Appl. Cryst. 29, 411-418.
7. Tang, L. & Thomas, G. (1993). J. Appl. Phys. 74, 5025-5032.
8. Tang, L., Lu, D. & Thomas, G. (1995). J. Appl. Phys. 77, 47-53.