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Volumn 70, Issue 11, 1996, Pages 1992-1996
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Application of electron and X-ray diffraction for measuring the electrostatic potential of crystalline MgO
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039623838
PISSN: 00444537
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (27)
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