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Volumn 80, Issue B, 1999, Pages 238-239

Secondary electron emission yields from clean Cu surfaces under low-energy singly and doubly charged ion impact

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EID: 0039621577     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (2)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.