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Volumn 80, Issue B, 1999, Pages 238-239
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Secondary electron emission yields from clean Cu surfaces under low-energy singly and doubly charged ion impact
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039621577
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
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References (7)
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