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Volumn 43, Issue 11, 2000, Pages 76-84

Time domain analysis of a printed circuit board via

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0039600875     PISSN: 01926225     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review
Times cited : (5)

References (6)
  • 6
    • 0030126782 scopus 로고    scopus 로고
    • Measuring parasitic capacitance and inductance using TDR
    • April
    • D. Dascher, "Measuring Parasitic Capacitance and Inductance Using TDR," Hewlett-Packard Journal, April 1996, pp. 83-96.
    • (1996) Hewlett-Packard Journal , pp. 83-96
    • Dascher, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.