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Surface properties of poly (ethylene terephthalate) modified by far-ultraviolet radiation at 193 nm (laser) and 185 nm (low intensity)
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P. Darles-Benet, thesis 1991, Universite de Bordeaux I
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Polarization charge model for laser-induced ripple patterns in dielectric materials
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M. Bolle, and S. Lazare, "Ablation of thin polymer films on Si or Metal substrates with the low intensity UV beam of the excimer laser or the Hg lamp: advantages of ellipsometric measurements". Appl. Surf. Sci. 54, 471, 1991.
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