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Volumn 51, Issue 10, 1996, Pages 1439-1442

Bis[tris(trimethylsilyl)methylzinc]triisopropylsilylphosphandiide, a geminally bis(alkylzinc) substituted phosphane;Bis[tris(trimethylsilyl)methylzink]triisopropylsilylphosphandiid, ein geminal bis(alkylzink)substituiertes phosphan

Author keywords

Bis(alkylzinc)phosphane; Phosphane; Triisopropylsilyl; X Ray; Zinc

Indexed keywords

CHEMISTRY; X RAYS; ZINC;

EID: 0039562676     PISSN: 09320776     EISSN: None     Source Type: Journal    
DOI: 10.1515/znb-1996-1013     Document Type: Article
Times cited : (14)

References (33)
  • 3
    • 0040467397 scopus 로고
    • C. A.
    • S. Miyano, T. Ohtake, H. Tokumasu, H. Hashimoto, Nippon Kagaku Kaishi 381 (1973); C. A. 78, 159784 (1973); J. J. Eisch, A. Piotrowski, Tetrahedron Lett. 24, 2043 (1983).
    • (1973) , vol.78 , pp. 159784
  • 4
    • 0001030871 scopus 로고
    • S. Miyano, T. Ohtake, H. Tokumasu, H. Hashimoto, Nippon Kagaku Kaishi 381 (1973); C. A. 78, 159784 (1973); J. J. Eisch, A. Piotrowski, Tetrahedron Lett. 24, 2043 (1983).
    • (1983) Tetrahedron Lett. , vol.24 , pp. 2043
    • Eisch, J.J.1    Piotrowski, A.2
  • 11
    • 2542631784 scopus 로고
    • S. C. Goel, M. Y. Chiang, W. E. Buhro, J. Am. Chem. Soc. 112, 5636 (1990); S. C. Goel, M. Y. Chiang, D. J. Rauscher, W. E. Buhro, J. Am. Chem. Soc. 115, 160 (1993); B. Rademacher, W. Schwarz, M. Westerhausen, Z. Anorg. Allg. Chem. 621, 287 (1995).
    • (1990) J. Am. Chem. Soc. , vol.112 , pp. 5636
    • Goel, S.C.1    Chiang, M.Y.2    Buhro, W.E.3
  • 12
    • 0000336209 scopus 로고
    • S. C. Goel, M. Y. Chiang, W. E. Buhro, J. Am. Chem. Soc. 112, 5636 (1990); S. C. Goel, M. Y. Chiang, D. J. Rauscher, W. E. Buhro, J. Am. Chem. Soc. 115, 160 (1993); B. Rademacher, W. Schwarz, M. Westerhausen, Z. Anorg. Allg. Chem. 621, 287 (1995).
    • (1993) J. Am. Chem. Soc. , vol.115 , pp. 160
    • Goel, S.C.1    Chiang, M.Y.2    Rauscher, D.J.3    Buhro, W.E.4
  • 13
    • 84987230158 scopus 로고
    • S. C. Goel, M. Y. Chiang, W. E. Buhro, J. Am. Chem. Soc. 112, 5636 (1990); S. C. Goel, M. Y. Chiang, D. J. Rauscher, W. E. Buhro, J. Am. Chem. Soc. 115, 160 (1993); B. Rademacher, W. Schwarz, M. Westerhausen, Z. Anorg. Allg. Chem. 621, 287 (1995).
    • (1995) Z. Anorg. Allg. Chem. , vol.621 , pp. 287
    • Rademacher, B.1    Schwarz, W.2    Westerhausen, M.3
  • 15
    • 84866197176 scopus 로고
    • A. Eichhoefer, J. Eisenmann, D. Fenske, F. Simon, Z. Anorg. Allg. Chem. 619, 1360 (1993); J. Eisenmann, D. Fenske, F. Simon, Z. Anorg. Allg. Chem. 621, 1681 (1995); M. G. Davidson, A. J. Edwards, M. A. Paver, P. R. Raithby, C. A. Russell, A. Steiner, K. L. Verhorevoort, D. S. Wright, J. Chem. Soc., Chem. Commun. 1989 (1995).
    • (1993) Z. Anorg. Allg. Chem. , vol.619 , pp. 1360
    • Eichhoefer, A.1    Eisenmann, J.2    Fenske, D.3    Simon, F.4
  • 16
    • 84987252006 scopus 로고
    • A. Eichhoefer, J. Eisenmann, D. Fenske, F. Simon, Z. Anorg. Allg. Chem. 619, 1360 (1993); J. Eisenmann, D. Fenske, F. Simon, Z. Anorg. Allg. Chem. 621, 1681 (1995); M. G. Davidson, A. J. Edwards, M. A. Paver, P. R. Raithby, C. A. Russell, A. Steiner, K. L. Verhorevoort, D. S. Wright, J. Chem. Soc., Chem. Commun. 1989 (1995).
    • (1995) Z. Anorg. Allg. Chem. , vol.621 , pp. 1681
    • Eisenmann, J.1    Fenske, D.2    Simon, F.3
  • 20
    • 0039282615 scopus 로고    scopus 로고
    • note
    • Weitere Einzelheiten zur Kristallstrukturuntersuchung können beim Fachinformations-zentrum Karlsruhe, D-76344 Eggenstein-Leopoldshafen, unter der Hinterlegungsnummer CSD-404902 angefordert werden.
  • 23
    • 0004150157 scopus 로고
    • Siemens Analytical X-Ray Instruments Inc.
    • G. M. Sheldrick, SHELXL-93, Program for Crystal Structure Determination, Universität Göttingen (1993); SHELXTL PC, Siemens Analytical X-Ray Instruments Inc. (1990); SHELXTL Plus, Siemens Analytical X-Ray Instruments Inc. (1989).
    • (1990) SHELXTL PC
  • 24
    • 0004150157 scopus 로고
    • Siemens Analytical X-Ray Instruments Inc.
    • G. M. Sheldrick, SHELXL-93, Program for Crystal Structure Determination, Universität Göttingen (1993); SHELXTL PC, Siemens Analytical X-Ray Instruments Inc. (1990); SHELXTL Plus, Siemens Analytical X-Ray Instruments Inc. (1989).
    • (1989) SHELXTL Plus
  • 29
    • 0001828649 scopus 로고
    • A. Almenningen, T. U. Helgaker, A. Haaland, S. Samdal, Acta Chem. Scand., Ser. A 36, 159 (1982); M. Westerhausen, B. Rademacher, J. Organomet. Chem. 443, 25 (1993).
    • (1993) J. Organomet. Chem. , vol.443 , pp. 25
    • Westerhausen, M.1    Rademacher, B.2
  • 31
    • 0000540256 scopus 로고
    • D. G. Gilheany, Chem. Rev. 94, 1339 (1994); W. Kutzelnigg, Angew. Chem. 96, 262 (1984), Angew. Chem., Int. Ed. Engl. 23, 272 (1984).
    • (1994) Chem. Rev. , vol.94 , pp. 1339
    • Gilheany, D.G.1
  • 32
    • 0000540256 scopus 로고
    • D. G. Gilheany, Chem. Rev. 94, 1339 (1994); W. Kutzelnigg, Angew. Chem. 96, 262 (1984), Angew. Chem., Int. Ed. Engl. 23, 272 (1984).
    • (1984) Angew. Chem. , vol.96 , pp. 262
    • Kutzelnigg, W.1
  • 33
    • 0343265434 scopus 로고
    • D. G. Gilheany, Chem. Rev. 94, 1339 (1994); W. Kutzelnigg, Angew. Chem. 96, 262 (1984), Angew. Chem., Int. Ed. Engl. 23, 272 (1984).
    • (1984) Angew. Chem., Int. Ed. Engl. , vol.23 , pp. 272


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