Structures and defects induced during annealing of sputtered near-equiatomic NiTi shape memory thin films

Applied Physics Letters

Volumn 69, Issue 18, 1996, Pages 2656-2658

  Gong, F F ^a   Shen, H M ^a   Wang, Y N ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039521787     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117549     Document Type: Article

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