Relationships between crystallinity and conductivity in evaporated C60 films

Synthetic Metals

Volumn 86, Issue 1-3, 1997, Pages 2357-2358

  Rikitake, Kouichi ^a   Akiyama, Takahiro ^a   Takashima, Wataru ^a   Kaneto, Keiichi ^a  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; polycrystalline thin films; Conductivity; Fullerenes; X ray diffraction

Indexed keywords

EID: 0039506510     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

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