The role of SiO2 impurities in the microstructure and properties of Y-TZP

Journal of Materials Processing Technology

Volumn 86, Issue 1-3, 1998, Pages 139-145

  Hodgson, S N B ^a   Cawley, J ^b   Clubley, M ^c  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^b SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^c MEL Chemicals   (United Kingdom)

Author keywords

Engineering ceramics; Mechanical properties; Microstructure; Silica (SiO2) impurities; Sintering; Tetragonal zirconia polycrystal (Y TZP); Yttria stabilized zirconia (ZrO2 Y2O3)

Indexed keywords

CERAMIC MATERIALS; COMPOSITION EFFECTS; CRYSTAL IMPURITIES; CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARIES; PHASE COMPOSITION; PHASE TRANSITIONS; POLYCRYSTALS; SILICA; SINTERING; TOUGHENING; YTTRIUM COMPOUNDS;

ENGINEERING CERAMICS; YTTRIA STABILIZED ZIRCONIA;

ZIRCONIA;

EID: 0039491463     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(98)00302-1     Document Type: Article

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