Piezoelectrically forced thickness-shear and flexural vibrations of contoured quartz resonators

Journal of Applied Physics

Volumn 79, Issue 7, 1996, Pages 3411-3422

  Lee, P C Y ^a   Wang, J ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039482983     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361388     Document Type: Article

References (5)

1. P. C. Y. Lee, S. Syngellakis, and J. P. Hou, J. Appl. Phys. 61, 1249 (1987).
2. P. C. Y. Lee and J. Wang, J. Appl. Phys. 75, 7681 (1994).
3. R. Bechmann, Phys. Rev. 110, 1060 (1958).
4. D. H. Bailey, ACM Trans. Math. Software 19, 288 (1993).
5. H. Sekimoto, Y. Watanabe. and M. Nakazawa, in Proceedings of the 1992 IEEE Frequency Control Symposium, 1992, pp. 532-536. order of magnitude greater than the corresponding ones at the forcing frequencies near other resonances.