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Volumn 78, Issue , 1996, Pages 107-110
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Si K and Co L3 XANES study of thin-film CoSi2
a a b c c d a c,e f g |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039464479
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/s0368-2048(96)80038-7 Document Type: Article |
Times cited : (5)
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References (22)
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