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Volumn 27, Issue 2, 1997, Pages 182-184
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Analysis of the applications of the Schwarzschild objective in the soft x-ray and VUV spectral ranges. 2. Diffraction modelling of aberrations
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039460606
PISSN: 10637818
EISSN: None
Source Type: Journal
DOI: 10.1070/QE1997v027n02ABEH000806 Document Type: Article |
Times cited : (3)
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References (10)
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