Allowing for current spreading in semiconductors during measurements of the contact resistivity of ohmic contacts

Semiconductors

Volumn 32, Issue 7, 1998, Pages 739-744

  Andreev, A N ^a   Rastegaeva, M G ^a   Rastegaev, V P ^a   Reshanov, S A ^a  

^a IOFFE INSTITUTE   (Russian Federation)

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Indexed keywords

EID: 0039449480     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1187496     Document Type: Article

References (16)

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