Electromigration-induced failure of single layered NiFe Permalloy thin films for a giant magnetoresistive read head

Journal of Applied Physics

Volumn 90, Issue 5, 2001, Pages 2427-2432

  Bae, Seongtae ^a   Judy, Jack H ^a   Tsu, I Fei ^b   Murdock, Edward S ^b  

^a University of Minnesota   (United States)

^b SEAGATE TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039436811     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1389337     Document Type: Article

References (18)

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