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Volumn 147, Issue 2, 1998, Pages 242-270

Uniqueness and Regularity for the Two-Dimensional Drift-Diffusion Model for Semiconductors Coupled with Maxwell's Equations

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EID: 0039402056     PISSN: 00220396     EISSN: None     Source Type: Journal    
DOI: 10.1006/jdeq.1998.3449     Document Type: Article
Times cited : (7)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.