Development of XUV laser applications at LSAI-LULI

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3156, Issue , 1997, Pages 124-134

  Jamelot, Gerard ^a   Albert, F ^a   Belsky, Alexander B ^b,c   Boussoukaya, Mustapha ^d   Carillon, Antoine ^a   Egbert, Andre ^e   Hubert, S ^a   Jaeglé, Pierre ^a   Joyeux, Denis ^f   Kamenskikh, I ^b   Klisnick, Annie ^a   Meyer, S ^e   Phalippou, Daniel ^f   Ros, David ^a   Rus, Bedrich ^g   Sebban, Stephane ^a   Wellegehausen, Bernd ^e   Woyvod, T ^e   Zeitoun, Philippe ^a   Zeitoun Fakiris, Anne ^d  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

^c UNIVERSITÉ LYON 1   (France)

^d CEA SACLAY   (France)

^e INSTITUT FÜR QUANTENOPTIK   (Germany)

^f INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

^g INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Innershell photoionisation; Photoluminescence; Surface analysis; X ray lasers; X UV interferometry

Indexed keywords

APPLICATIONS; ATOMIC PHYSICS; INTERFEROMETERS; INTERFEROMETRY; IONIZATION; LASER APPLICATIONS; LASERS; LIGHT EMISSION; LUMINESCENCE; PHOTOIONIZATION; PHOTOLUMINESCENCE; SURFACE ANALYSIS; ZINC;

HIGH-BRIGHTNESS (HB); INNERSHELL PHOTOIONISATION; RESEARCH AREA (RA); SOLID STATES; UV LASERS; X-UV INTERFEROMETRY;

X RAY LASERS;

EID: 0039397021     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.284821     Document Type: Conference Paper

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