A comparative STM and SPA-LEED study on the evolution of strain induced stripe pattern on Cu/Ni(100)

Surface Science

Volumn 376, Issue 1-3, 1997, Pages 113-122

  Nedelmann, L ^a   Muller B ^a   Fischer, B ^a   Kern, K ^a   Erdos D ^b   Wollschlager J ^b   Henzler, M ^b  

^a EPFL   (Switzerland)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

Copper; Low energy electron diffraction; Molecular beam epitaxy; Nickel; Scanning tunneling microscopy; Surface stress; Surface structure, morphology, roughness and topography

Indexed keywords

LOW ENERGY ELECTRON DIFFRACTION; METALLIC SUPERLATTICES; MOLECULAR BEAM EPITAXY; NICKEL; SCANNING TUNNELING MICROSCOPY; STRESS RELAXATION; SURFACE ROUGHNESS;

FACETING; STRIPE PATTERN FORMATION;

COPPER;

EID: 0039384216     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01309-X     Document Type: Article

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