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Volumn 64, Issue 13, 1994, Pages 1653-1655

Nanoindentation hardness measurements using atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0039352172     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.111949     Document Type: Article
Times cited : (229)

References (15)
  • 15
    • 84951360518 scopus 로고    scopus 로고
    • (personal communications). They are developing a similar substraction technique
    • Lu, C.J.1    Bogy, D.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.