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Volumn 37, Issue 4, 1980, Pages 371-373
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Picosecond optoelectronic detection, sampling, and correlation measurements in amorphous semiconductors
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039310018
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.91947 Document Type: Article |
Times cited : (189)
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References (12)
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