Pion induced displacement damage in silicon devices

Nuclear Inst. and Methods in Physics Research, A

Volumn 335, Issue 3, 1993, Pages 580-582

  Huhtinen, M ^a   Aarnio, P A ^b  

^a UNIVERSITY OF HELSINKI   (Finland)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039284177     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(93)91246-J     Document Type: Letter

References (28)

1. CERN CMS TN/92-35
2. Measurement of proton induced radiation damage to CMOS transistors and p-i-n diodes
3. High energy electron induced displacement damage in silicon