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Volumn 9, Issue 3, 1997, Pages 28-31

Tackling detector non-linearity in Fourier transform infrared spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

BREAKDOWN PRODUCTS; DIFFERENT PATHLENGTH; ELECTRICAL EQUIPMENT; LEAK-FREE; LINEAR RESPONSE; MCT DETECTOR; PHOTON FLUX; QUANTITATIVE DETERMINATIONS;

EID: 0039263065     PISSN: 09660941     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (9)
  • 2
    • 84893807357 scopus 로고    scopus 로고
    • Laboratòrio Central de Pesquisa e Desenvolvimento, COPEL-LAC, Rua Coronel Dulcídio 800. 80420 Curitiba, Brazil
    • Laboratòrio Central de Pesquisa e Desenvolvimento, COPEL-LAC, Rua Coronel Dulcídio 800. 80420 Curitiba, Brazil.
  • 3
    • 84893716651 scopus 로고    scopus 로고
    • Patent, Bundesrepublik Deutschland, Nr. 195 28 290, Munich, 23 January
    • Patent, Bundesrepublik Deutschland, Nr. 195 28 290, Munich, 23 January (1997).
    • (1997)
  • 7
    • 0005747317 scopus 로고
    • Correction of Non-linearities in detectors in Fourier Transform Spectroscopy
    • Bruker Analytische Messtechnik GmbH, Rheinstetten, Germany, US Patent 4,927,269, May 22
    • A. Keens and A. Simon, Bruker Analytische Messtechnik GmbH, Rheinstetten, Germany, "Correction of Non-linearities in detectors in Fourier Transform Spectroscopy". US Patent 4,927,269, May 22 (1990).
    • (1990)
    • Keens, A.1    Simon, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.